IPERION HSIntegrating Platforms for the European Research Infrastructure ON Heritage Science

Atomic Force Microscopy (AFM)

AFM is a scanning probe microscopy (SPM), used for imaging the sample surface in 3D down to the nanometer range, in air or in liquids (in a fluid cell). Different scanning techniques are available, such as, tapping, contact and non-contact AFM modes, magnetic force microscopy (MFM), and phase imaging.

Fields of application

  • Cultural heritage

    archaeological object and site, architecture, art, decorative arts, demo anthropologic object, film, manuscript, mosaics, musical instrument, other, painting, papyrus, photo, sculpture, textile


  • inorganic

    glass, stone, metal and metallurgical By-Products, ceramic (clay, mud brick, terracotta, earthenware, stoneware, porcelain), pigment

  • organic

    animal parts, binding media, glues, wood, paper, textiles, varnishes