Rhodium excitation source with a Be 100µm thick window, tension 50kV max., current 600µA max., polycapillary lens, 5 filters that can be selected for a better detection of specific elements, SDD detector with a Peltier cooler. Beam size: from 700 down to 100µm. Mapping of flat surfaces up to 80x60cm². The target might be placed horizontally or vertically.
Potential Results
XRF identifies chemical elements present on materials, from Na to U. In particular, µXRF mapping allows to get images of the distribution of these elements on the surface analyzed.