IPERION HSIntegrating Platforms for the European Research Infrastructure ON Heritage Science
Technique: Variable pressure scanning electron microscopy with energy dispersive X-ray spectroscopy (VP-SEM/EDS)

SEM with EDS / EDX

The Jeol JSM-IT500LA is a variable pressure scanning electron microscope equiped with energy dispersive spectroscopy. The instrument uses a tungsten filament and can yield high quality images of inorganic and organic materials and at variable accelerating voltages from 30 kev to 1 keV. Gold and carbon coating is available.

Potential Results

Secondary electron images, backscatter electron images, qualitative and quantitative elemental analysis